A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...
In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...
Magnetic force microscopy (MFM) is one of the modes of scanning probe microscopy (SPM). As the name implies, it is used to map magnetic characteristics. MFM investigates the local magnetic fields at ...
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