Ripples arise while characterizing devices at RF and microwave frequencies. RF engineers need to make sure that measurement set-up is properly calibrated and matched in order to avoid measurement ...

Figure 1: CLCs and multi-CLC systems with a single pitch. Figure 2: Simulated reflection spectra of multi-CLC systems at normal incidence of L-CP. Hence, we can conclude that broader multiple PBGs ...

Manufacturers are adopting automated optical inspection (AOI) systems based on phase shift profilometry (PSP) for applications in advanced packaging processes. Many of these processes use front ...

In my review of AirFoil Speakers Touch 3.0, I wrote about AirPlay: Ever since developers started reverse-engineering the AirPlay protocol that Apple introduced with iOS 4.2 in November 2010, we have ...

NanoResolution MRS Sensor Delivers Fast, Precise 3D Inspection And Measurement For Advanced Semiconductor Packaging Applications How a multiple reflection suppression (MRS) sensor uses phase shift ...