Using AI and machine learning as transformative solutions for semiconductor device modeling and parameter extraction.
Abstract: Feature extraction and selection in the presence of nonlinear dependencies among the data is a fundamental challenge in unsupervised learning. We propose using a Gram-Schmidt (GS) type ...
Abstract: In remote sensing image building extraction, image regions with similar textures or colors often cause false positives and false negatives in building-detection. Global features can help the ...
Cui, J.X., Liu, K.H. and Liang, X.J. (2026) A Brief Discussion on the Theory and Application of Artificial Intelligence in ...
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