Validate cross-chip data paths in multi-die packages and evaluate the impact on power, performance, and reliability.
Adaptive test is starting to gain traction for high-performance computing and AI chips as test programs that rely on static limits and fixed test sequences reach their practical limits.
A new article examines the history of computing to help outline the direction of quantum research. It reports that quantum ...
Analog circuit design consists of the pre-layout and layout phases. Among them, the pre-layout phase directly decides the final circuit performance, but heavily depends on experienced engineers to do ...
Abstract: Wound-rotor synchronous generators (WRSGs) are the main structures used in aircraft power systems. As a key component of WRSGs for realizing brushless commutation, rotary rectifiers (RRs) ...
Morning Overview on MSN
Single crystal achieves on-demand topological switching
Topological materials promise electronics that are faster, cooler, and far more robust, but until now they have mostly ...
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